What is D algorithm in VLSI testing?
What is D algorithm in VLSI testing?
The D algorithm is a deterministic ATPG method for combinational circuits, guaranteed to find a test vector if one exists for detecting a fault. It uses cubical algebra for the automatic generation of tests.
What is the hypothesis based on which D algorithm works in VLSI?
Explanation: D-algorithm is based on the hypothesis of the existence of two machines – one good machine and one faulty machine.
What is Podem?
PODEM (Path-Oriented Decision Making) is an Automatic Test Pattern Generation (ATPG) algorithm which was created to overcome the inability of D-Algorithm (D-ALG) to generate test vectors for circuits involving Error Correction and Translation.
What type of gates does the J frontier comprise of?
The J-frontier consists of all the gates in the circuit whose output values are known (can be any of the five values in the 5-valued logic) but is not justified by its inputs.
Why is ATPG used?
ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and …
What percentage of faults are easier to detect?
Explanation: It is relatively easy to detect the first 80% of faults using various classical test strategies.
Where is the discrepancy in D-algorithm driven to and observed and thus detected?
Clarification: In D-algorithm, a systematic means is provided to driven the discrepancy to output and it is observed and detected.
What is ATPG effectiveness?
The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns).
Which is the sequential circuit?
A Sequential circuit is a combinational logic circuit that consists of inputs variable (X), logic gates (Computational circuit), and output variable (Z). That means sequential circuits include memory elements that are capable of storing binary information.
What are the types of fault simulation?
Fault Simulation.
