What is ToF-SIMS used for?

What is ToF-SIMS used for?

ToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples.

Can ToF-SIMS provide quantitative information about sample surface composition?

Such a platform enables qualitative and quantitative measurements of surface composition for the fine spray dried ASD particles with ultrasurface-sensitivity (less than 10 nm from the surface) and superior spatial resolution (approximately 250 nm for ToF-SIMS).

Why different ion beams are used in Sims?

In “dynamic SIMS” mode the primary ion beam exceeds the “static limit” (~1E12 ions/cm2) producing a high yield of secondary ions. This technique is used for “bulk” analysis of elements and isotopes, and is particularly well-suited for analysis of isotopes and trace elements in minerals (e.g. REE in garnet).

How does static SIMS instrumentally differ from dynamic Sims?

Static SIMS is the process involved in surface atomic monolayer analysis, or surface molecular analysis, usually with a pulsed ion beam and a time of flight mass spectrometer, while dynamic SIMS is the process involved in bulk analysis, closely related to the sputtering process, using a DC primary ion beam and a …

How do you read ToF on Sims?

TOF-SIMS spectra are typically displayed as a plot of signal intensity or ion counts on the Y-axis versus m/z on the X-axis. The height of a signal is proportional to the amount of that ion present in the spectrum and the m/z of the ion is basically the mass of that ion (if it is singly charged).

What is ToF analysis?

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. The particles are removed from atomic monolayers on the surface (secondary ions).

How does ion mobility spectrometry work?

In an ion mobility spectrometer, organic molecules are ionized and driven by an electric field against a counterflow of neutral drift gas. In their way to the detector, the ions collide multiple times with the drift gas, which reduce their speed. After each collision, ions are accelerated again by the imposed field.

How does selected ion monitoring work?

Selected ion monitoring (SIM) is a mass spectrometry scanning mode in which only a limited mass-to-charge ratio range is transmitted/detected by the instrument, as opposed to the full spectrum range. This mode of operation typically results in significantly increased sensitivity.

What is ToF SIMS analysis?

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. Analytical capabilities of ToF-SIMS include: Mass resolution of 0.00x amu.

Are Sims destructive?

Secondary ion mass spectroscopy (SIMS) is a destructive analytical technique in which material is removed from a surface by ion beam sputtering, and the resultant positive and negative ions are mass analyzed in a mass spectrometer [62].

What is ToF-SIMS analysis?

What is ioniontof – TOF-SIMS?

IONTOF – TOF-SIMS (time of flight secondary ion mass spectrometry) – LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis

What does TOF-SIMS stand for?

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular ions with mass-to-charge ratios ranging from m/z 1 to m/z 10,000 in a single spectrum. Combined with this molecular specificity, the technique can provide chemical images with

What is the advantage of TOF-SIMS over other methods?

Analyzing these secondary ions provides information about the molecular, inorganic and elemental species present on the surface. For example, if there were organic contaminants such as oils adsorbed on the surface, TOF-SIMS would reveal this information, whereas other techniques may not, particularly at very low levels.

What is the resolution of TOF-SIMS analysis?

Because it is possible to measure the “time-of-flight” of the particles from the time of impact to detector on a scale of nano-seconds, it is possible to produce a mass resolution as fine as 0.00X atomic mass units (i.e. one part in a thousand of the mass of a proton). Under typical operating conditions, the results of ToF-SIMS analysis include: